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IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 12 > 3460 - 3467
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4273 - 4278
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 3914 - 3921
IEEE Design & Test > 2016 > 33 > 5 > 7 - 15
IEEE Journal on Emerging and Selected Topics in Circuits and Systems > 2016 > 6 > 3 > 330 - 338
IEEE Journal on Emerging and Selected Topics in Circuits and Systems > 2016 > 6 > 3 > 279 - 292
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 370 - 375
IEEE Journal of the Electron Devices Society > 2016 > 4 > 5 > 321 - 327
IEEE Electron Device Letters > 2016 > 37 > 8 > 1014 - 1017
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3109 - 3115
IEEE Electron Device Letters > 2016 > 37 > 7 > 878 - 881
IEEE Journal on Emerging and Selected Topics in Circuits and Systems > 2016 > 6 > 2 > 163 - 170
IEEE Journal on Emerging and Selected Topics in Circuits and Systems > 2016 > 6 > 2 > 146 - 162
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 5 > 1783 - 1793
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 5 > 1885 - 1894
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1877 - 1883
IEEE Electron Device Letters > 2016 > 37 > 5 > 580 - 583
IEEE Transactions on Circuits and Systems II: Express Briefs > 2016 > 63 > 4 > 336 - 340
IEEE Transactions on Circuits and Systems I: Regular Papers > 2016 > 63 > 3 > 389 - 400
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 2 > 173 - 186