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IEEE Electron Device Letters > 2017 > 38 > 11 > 1547 - 1550
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 593 - 595
IEEE Transactions on Biomedical Circuits and Systems > 2016 > 10 > 6 > 1079 - 1086
23rd IEEE International SOC Conference > 330 - 333