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IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 2 > 176 - 180
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 290 - 297
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 9 > 2911 - 2917
IEEE Electron Device Letters > 2016 > 37 > 3 > 269 - 271
IEEE Solid-State Circuits Magazine > 2016 > 8 > 4 > 10 - 13
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 11 > 3232 - 3242
IEEE Transactions on Nuclear Science > 2015 > 62 > 5-2 > 2302 - 2309
Eurocon 2013 > 1955 - 1963