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2017 IEEE International Reliability Physics Symposium (IRPS) > 3F-1.1 - 3F-1.6
2016 IEEE International Reliability Physics Symposium (IRPS) > EL-2-1 - EL-2-5
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 4 > 746 - 750
2011 International Reliability Physics Symposium > EL.3.1 - EL.3.6
2011 International Reliability Physics Symposium > CP.2.1 - CP.2.6
EOS/ESD Symposium Proceedings > 1 - 6
EOS/ESD Symposium Proceedings > 1 - 8
EOS/ESD Symposium Proceedings > 1 - 5
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 118 - 125
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 2061 - 2071
IEEE Electron Device Letters > 2011 > 32 > 7 > 967 - 969
IEEE Transactions on Electron Devices > 2011 > 58 > 9 > 2974 - 2980
2010 International Electron Devices Meeting > 35.5.1 - 35.5.4
2010 International Electron Devices Meeting > 35.4.1 - 35.4.4