The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
The degradation of MOSFET device performance in time (aging), caused by hot-carrier injection (HCI) and negative/positive bias-temperature instability (N/PBTI), is increasingly more responsible for IC reliability failure in advanced process technology nodes. Device scaling, that has allowed increased performance of CMOS circuits, has also resulted in a magnification of such reliability issues. At...
Channel Hot Carrier (CHC) and Negative Bias Temperature Instability (NBTI) degradation has been studied in pMOSFETs with and without channel strain. The results show larger CHC degradation and a neglegible influence of NBTI on strained pMOS devices. The degradation effects are modeled to be introduced in a circuit simulator. The simulations of a CMOS inverter, which has been chosen as example circuit,...
This paper proposes a quaternary-to-binary logic decoder using current-mode multiple-valued logic (MVL) CMOS circuits. The circuit is achieved a device reduction of 23.5%, an interconnection reduction of 25.0%, and a power-delay-product reduction of 43.1%. Therefore, this circuit is superior to the previous circuit in both the circuit occupied area and the reliability. The validity and effectiveness...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.