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Although progress has been made in the development of submillimeter-wave monolithic integrated circuits, the evaluation of these circuits still relies on test fixtures, which makes testing expensive and time consuming. Based on a W-band prototype, a micromachined on-wafer probe covering frequencies 500–750 GHz is built to simplify submillimeter-wave integrated circuits testing. This paper demonstrates...
The thermal distribution of polycrystalline-silicon (poly-Si) thin-film transistors (TFTs) with sizes close to the nanoregime is analyzed by means of a fluorescent nanothermographic imaging technique based on the heat-induced fluorescence feature of polydiacetylene (PDA) supramolecules. The direct detection of nanoscale hot spots generated by hot carriers in poly-Si TFTs is demonstrated with sufficient...
Analog and digital ICs are built up with bipolar or MOS (Metal Oxide Semiconductor) transistors. Such miniaturized transistor structures can fail when the thermo-mechanical stress becomes critical. The main aim of this work is to analyze the thermo-mechanical stress in integrated devices. Different approaches have been proposed to determine the thermo-mechanical stress effect in an IC device, based...
The field of electronic noses and gas sensing has been developing rapidly since the introduction of the silicon based sensors. There are numerous systems that can detect and indicate the level of a specific gas. We introduce here a system that is low power, small and cheap enough to be used in mobile robotic platforms while still being accurate and reliable enough for confident use. The design is...
In deep submicron era, to prevent larger amount of SRAM from more frequently encountered overheating problems and react accordingly for each possible hotspots, multiple ideal run-time temperature sensors must be closely located and response rapidly to secure system reliability while maintaining core frequency. This paper presented a method to extract run-time temperature information from multiple...
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