Advanced search
Advanced search in people
IEEE Transactions on Electron Devices > 2013 > 60 > 6 > 1938 - 1943
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 171 - 178
IEEE Transactions on Electron Devices > 2013 > 60 > 6 > 1938 - 1943
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 171 - 178