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IEEE Electron Device Letters > 2018 > 39 > 1 > 135 - 138
IEEE Transactions on Circuits and Systems II: Express Briefs > 2018 > 65 > 1 > 101 - 105
IEEE Electron Device Letters > 2017 > 38 > 12 > 1665 - 1668
IEEE Transactions on Parallel and Distributed Systems > 2017 > 28 > 11 > 3089 - 3099
Proceedings of the IEEE > 2017 > 105 > 9 > 1770 - 1789
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3498 - 3501
IEEE Journal of Solid-State Circuits > 2017 > 52 > 8 > 2194 - 2207
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3452 - 3458
IEEE Transactions on Nanotechnology > 2017 > 16 > 4 > 677 - 686
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 6 > 1018 - 1029
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 6 > 1807 - 1820
IEEE Electron Device Letters > 2017 > 38 > 5 > 641 - 644
IEEE Transactions on Nanotechnology > 2017 > 16 > 3 > 387 - 395
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 1973 - 1980
IEEE Sensors Journal > 2017 > 17 > 8 > 2524 - 2533
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1204 - 1214
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1236 - 1249
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1812 - 1817
IEEE Access > 2017 > 5 > 12895 - 12912
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 1 > 125 - 138