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Static test compaction procedures that modify tests perform the modification so as to increase the number of faults that some of the tests detect, thus making other tests unnecessary. Tests that become unnecessary are removed from the test set without reducing the fault coverage. This paper describes a static test compaction procedure of this type for transition faults that has the following additional...
This paper presents a novel low-area scan-based logic built-in self-test (LBIST) scheme that addresses stringent test requirements of certain application domains such as the fast-growing automotive electronics market. These requirements, largely driven by safety standards, are met by significantly reducing test application time while preserving the high fault coverage of conventional BIST schemes...
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