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Tail bits in the RESET process influence the distribution of resistive parameters, and will dramatically decrease the uniformity in high electric stimuli region. In this study, such phenomena can be explained as non-uniform distribution of defects in the insulating layer and high defects density in the bottleneck region of conductive filament (CF). Then departing from defects' distribution function,...
In this paper, a new and simple method named Weibull criterion is proposed to identify whether metastable states occur in single random telegraph noise (RTN), which has been verified by both simulation and experiment results. It is helpful for comprehensive understanding of trap properties and providing a direct evidence of oxide traps with multiple states.
An analytical model for the conduction characteristics of commercially available light-emitting diodes (LED) subjected to severe degradation conditions is reported. The devices were stressed at different temperatures in the range from 27°C to 80°C using high-current (80mA) accelerated life-tests. First, a modified compact model for the fresh I-V characteristic of the devices is presented. Instead...
Modeling the negative bias temperature instability (NBTI) can optimize circuit design. Several models have been proposed and all of them can fit test data well. These models are extracted typically by fitting short accelerated stress data. Their capability to predict NBTI aging outside the test range has not been fully demonstrated. This predictive capability for long term aging under low operation...
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