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Here we report on the efficient detection of THz radiation generated from Ti:sapphire femtosecond laser system. The large-area interdigitated antenna is excited by optical pulses with pulse duration from 15 to 47 fs. We have tested two AlGaN/GaN HEMT-based THz detectors with integrated broadband antennas. Detectors are comparable in sensitivity but differ in applied parasitic signals elimination techniques...
In this paper, we present a consistent perspective to interpret the channel noise of MOSFETs as suppressed shot noise for both long- and short-channel devices. We also derive an easy-to-use analytical equation for the shot noise suppression factor of MOSFETs working in the saturation region. The expression only relies on two process parameters - threshold voltage and effective oxide thickness, to...
The standard DC and RF and characteristics were measured for the 28 nm p- and n- type MOSFETs. The charge based compact model EKV3 parameters were extracted and verified against measured data. Noise parameters for both n- and p-MOSFETs were measured and analyzed in terms of gate induced noise correlation with the drain current noise, short channel effects related noise. The PRC noise model as well...
Here we present a detailed study on estimation of noise-dependent parameters, such as signal-to-noise ratio (SNR) or noise equivalent power (NEP), of field-effect-transistor based terahertz detectors (TeraFETs). Commonly, these parameters are estimated from a well-known assumption, that detector's performance is limited by the thermal noise of transistor's channel. However, practice shows that the...
A standardized approach to characterizing low-frequency noise for semiconductor devices is presented in this paper. The purpose of this measurement technique is to easily compare performances of different devices from different technologies in order to develop high-precision low-noise technologies. The methodology which measures noise current at the output of the device is used for accurate model...
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