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Scan design is a de facto design-for-testability technique that enhances access during the manufacturing test process. However, it can also be exploited to leak secret information off a secure chip. A mode-reset countermeasure has been used to thwart all the existing scan attacks, as they all rely on switching between the test and normal modes. Recently, the countermeasure was circumvented by a new...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.