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Runtime reconfigurable architectures based on Field-Programmable Gate Arrays (FPGAs) are attractive for realizing complex applications. However, being manufactured in latest semiconductor process technologies, FPGAs are increasingly prone to aging effects, which reduce the reliability of such systems and must be tackled by aging mitigation and application of fault tolerance techniques. This paper...
A series of breakthroughs in memristive devices have demonstrated the potential of using crossbar-based memristor arrays as ultra-high-density and low-power memory. However, their unique device characteristics could cause data disturbance for both read and write operations resulting in serious data reliability problems. This paper discusses such reliability issues in detail and proposes a comprehensive...
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