The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Mobile cellular terminals built for new cellular communication systems rely heavily on advanced semiconductor parts. This paper gives an overview of the various implementations currently in use in commercial GSM products. It discusses the recently announced evolutions and offers conclusions on longer term perspectives both at ASIC and Terminal product standpoints.
Following existing trends in microelectronics increasing demands are put on the performance of chip-internal signal measurement techniques. As the tools for circuit design and simulation are improving steadily design errors on first silicon are becoming rare, however, they reflect more subtle circuit problems which call for highly accurate measurements. Beside the electron beam tester, which is a...
The evolution of the SOI material, devices and circuit applications is reviewed over the last ten years and demontrates that SOI has now reached a level of maturity which renders it suitable for a number of applications. Low-power, high-temperature, high-performance analog and microwave capabilities of SOI are discussed into further detail.
This paper surveys techniques and strategies aimed at minimizing electro-magnetic coupling and interaction on mixed-signal IC's. Consideration is given to substrate coupling, power rail and i/o driver resonances, near field capacitive and inductive as well as package interaction and module level radiated emissions.
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.