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This paper discusses a novel RF Built-in-Self-Test (RF-BiST) targeting to replace the traditionally expensive and time-consuming RF parametric phase error test on a GSM/EDGE Digital Radio Processor (DRP) radio transceiver. The verification of the RF BiST in a production environment and a comparison of the internal BiST vs. the current test in are presented, which validates the RF BiST as an accepted...
This paper proposes a novel histogram BIST scheme for ADC static testing. For a monotonic ADC, the out codes have an approximate stair-like proportional relationship to the input signal. Based on this property, a space decomposition technique is proposed to reduce the testing time. By utilizing this technique, ADC??s static parameters can be estimated in shorter testing time with low hardware overhead...
In this paper, we have proposed a new high precision ramp waveform generator for low cost ADC test. With proposed test method combined with histogram analysis, an ADC can be easily tested on general digital testers. In our approach, we combine a traditional ramp generator with proper gain of operational amplifier (OPA) for ADC test. This new ramp generator structure can reduce the effect of output...
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