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Poly (styrene-b-butadiene-b-styrene) (SBS) triblock copolymer templates which present in-plane cylinder pattern have been prepared by solvent-induced order-disorder phase transition method. Then silver clusters have been deposited onto the SBS copolymer templates by low energy clusters beam deposition (LECBD) apparatus. The characterization of samples by AFM with tapping-mode has shown that silver...
Quantitative friction measurement of nano materials in atomic force microscope (AFM) requires accurate calibration method for the lateral force. An improved calibration method for the lateral force of the cantilever in AFM is presented. The calibration factor derived from the original method increased with the applied normal load, which indicates that separate calibration should be required for every...
A comparative study of the micro-tribological properties of silicon-based component and octadecyltrichlorosilane (OTS) molecular lubricant film which was prepared on Si(100) substrate, and their adhesive and tribological properties were mainly investigated by AFM/LFM. Meanwhile, the effect of relative humidity and scanning velocity was taken into consideration. The results show that the adhesive force...
In this paper, The datum line assessing surface roughness parameters and main three profile height parameters of surface roughness are introduced in detail, and the emphasis is laid on the operation principle of Atomic Force Microscopy Institute of Particle Physics Chongqing University (AFM.IPC-208B) and its software implementation method on the nanometer scale surface roughness measurement. The three-dimensional...
Tapping-mode atomic force microscope (TM-AFM) is currently the most widely utilized instrument for atomic-resolution imaging and nano-manipulation. However, the complex cantilever-tip dynamics has not been fully understood due to the inherent nonlinear property of tip-sample interaction. Experiments and analytical techniques are two basic methods to investigate the nonlinear effects, but they are...
The study on small molecular space morphology of nanometer material by a high-resolution Atomic Force Microscopy (AFM) is introduced in this paper. The high-resolution AFM.IPC-208B was developed by Chongqing University, and its precision: lateral resolution is 0.1 nm, vertical resolution is 0.01 nm. Applying AFM.IPC-208B, we obtained the surface structures of five samples (natural white mica, polyimide,...
The golden-like (Ti, Zr)N film with nanometer level, which has higher rigidity and better corrosion resistance than TiN film, was deposited by reactive magnetron sputtering on slides and Al substrates. The crystalline phase was analyzed by XRD, morphology and electronic structures were detected by atomic force microscopy (AFM) on AFM.IPC-208B developed by Chongqing University. The results of XRD show...
In this paper the Al2O3 nanowire is grown on silicon chips by electrochemical reaction under AFM probe. The obtained Al2O3 nanowire is regular arranged, the length and width of the nanowire can be controlled by adjusting applied voltage and scanning rate of AFM probe
In order to avoid the displacement of the AFM cantilever in surface forces measurement, a force-balanced MEMS sensor is developed. The probe of the sensor is a pendulous micromachined sensing element, which can be considered as a pair of differential capacitors. When the sensor is designed as a closed-loop system, the electrostatic force feedback can balance the surface force supplied on the sensing...
The standard application of atomic force microscope (AFM) is observation with subnanometer resolution. As development of nano-tech, AFM has also become popular as a simple manipulation tool. We have proved that developing a haptic user interface (HUI) can significantly improve these functions of AFM. When going on observation, under the assistance of HUI, the user can not only observe surface characters...
Ideally the atomic force microscope (AFM) provides three-dimensional structure of surfaces at high resolution. Nevertheless, there are some requirements for work with biological specimens which should be taken into consideration in the design of an AFM. And a key requirement is that the AFM should be capable of scanning over relatively large areas. In this paper we introduce an experimental AFM head...
In this study we predict the frequency modulation atomic force microscopy (FM-AFM) subatomic frequency shift images of a Si (001) surface using empirical potential molecular dynamic methods. We model carbon single-wall nanotube caped tip and Si (001) surface to investigate the tip-surface interaction. The simulation shows that the FM-AFM imaging force mainly comes from C-Si/C-C chemical covalent bonding...
This study produces low-temperature poly-silicon (LTPS) film by aluminum induced crystallization (AIC) method on Corning Eagle2000 glass substrate. Through the control of different sputtering power in depositing aluminum film, five kinds of specimens with sputtering power of 100, 200, 400, 800 and 1600 Watts, respectively, are made. Crystal quality, surface morphology, roughness and film residual...
Three SPM-based techniques are put forward to fabricate 1D and 2D nanoscale reference materials, i.e. atomic force microscopy (AFM) tip-induced anodic oxidation on Si substrate, scanning tunneling microscopy (STM) current-induced oxidation on Ti film as well as AFM tip-scratching on Au film. The experimental parameters are analyzed and classified. For AFM tip-induced anodic oxidation on Si substrate...
Self-welded double-wall and multi-wall carbon nanotube (DWCNT and MWCNT) bridges were used for the first time as nano-scale piezoresistors to monitor vibration and deformation of silicon cantilever beams. The CNTs were grown using low-pressure metal-catalyzed chemical vapor deposition technique between silicon-on-insulator posts situated over cantilever beams such that when the beams were deformed,...
An amperometric biosensor based on Prussian blue (PB) modified indium tin oxide (ITO) electrode was developed. The roughness of PB film which affects the electrocatalytic properties of PB film was controlled by varying deposition voltage and time. Atomic force microscopy (AFM) was used to measure the roughness of PB films deposited under various conditions. We used capillary electrophoresis (CE) method...
Carbon nanotube (CNT) is found to be an amazing material for nanoelectronics due to its unique properties. It provides the possibility of miniaturizing the traditional electronic elements. Recently, people have been focusing on exploring its applications on optoelectronics because CNT is a direct bandgap material and its bandgap is inversely related to its diameter. Thus, it is ease for photon adsorption...
As the optical alignment system for lithography cannot be compatible with the equipment and the manufacturing process in nanofabrication with scanning probe microscope, new precision alignment methods are required. In this paper, we investigated ultra-precision alignment system especially to the overlay in SPL technology and completed the fabrication of two-layer graphics by AFM oxidation. On the...
Carbon nanotube (CNT) is a useful material for gas sensing applications because of its high surface to volume ratio structure. In this work, multi-wall CNTs are incorporated into tin oxide thin film by the means of powder mixing and electron beam evaporation and the enhancement of gas-sensing properties is presented. The CNTs were combined with SnO2 powder with varying concentration in the range of...
This paper focuses on nano-scale analysis of mechanical properties of polymer and carbon nanotubes (CNT) embedded MEMS devices using the probe tip of the atomic force microscope (AFM). The mechanical properties of surfaces of layered materials were investigated by using nanoindentation produced with tips of an AFM. Experiment results indicated the bending characteristics of the device and could also...
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