IEEE Transactions on Device and Materials Reliability
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 3 > 360 - 365
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 98 - 105
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 106 - 111
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 323 - 327
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 254 - 262
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 3 > 484 - 489
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 86 - 93
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 113 - 123
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 285 - 295
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 510 - 519
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 420 - 427
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 347 - 356
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 529 - 531
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 252 - 257
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 54 - 65
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 3 > 413 - 419
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 21 - 29
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 35 - 41
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 555 - 563
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 203 - 212