IEEE Transactions on Device and Materials Reliability
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 6 - 13
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 194 - 200
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 98 - 105
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 107 - 112
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 133 - 138
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 15 - 23
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 399 - 405
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 306 - 310
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 347 - 356
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 252 - 257
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 154 - 160
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 3 > 890 - 897
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 1 > 47 - 53
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 149 - 155
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 174 - 180
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 423 - 428
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 610 - 616
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 38 - 42
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 74 - 79
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 272 - 274