IEEE Transactions on Device and Materials Reliability
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 228 - 234
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 145 - 152
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 160 - 167
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 304 - 311
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 272 - 276
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 312 - 322
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 3 > 576 - 581
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 305 - 310
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 367 - 371
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 82 - 86
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 142 - 148
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 301
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 3 > 324 - 337
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 339 - 348
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 3 > 458 - 465
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 4 - 9
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 177 - 179
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 37 - 43
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 428 - 436
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 156 - 160