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The prevalence of bridging defects makes bridging fault models important to consider during fault simulation and test generation. The large number of bridging faults that can be defined for a circuit led to the development of procedures for selecting subsets of bridging faults that are likely to occur based on the circuit layout, and hard-to-detect bridging faults whose coverage provides a more effective...
Static test compaction procedures that modify tests perform the modification so as to increase the number of faults that some of the tests detect, thus making other tests unnecessary. Tests that become unnecessary are removed from the test set without reducing the fault coverage. This paper describes a static test compaction procedure of this type for transition faults that has the following additional...
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