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In this paper, the gated imaging technique of dynamic photon emission is realized and introduced as a powerful localization tool by using a low-cost near-infrared InGaAs image intensifier (I.I). At first, the setup and the method for gated imaging of photon emission microscope (GI-PEM) are presented. As one of global localization tools, it shows an unique and economical debugging and pinpointing capabilities...
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