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The effect of solder joint size on wafer level chip scale package reliability has been studied through simulation. A two dimensional finite element model with different solder diameter (250µm, 300µm, 350µm) was studied under accelerated thermal cycling. The failure of the solder joints under thermal fatigue loading is influenced by the solder joint size. Finite element modelling can be used to study...
Presence of a thermal enabling load applied to Ball Grid Array (BGA) components creates a distinctive set of evaluations to be completed for reliability of solder joints (SJ) that connect the BGA to the board. This becomes especially relevant for newer technologies that drive to smaller component form factors. In this comprehensive study, a computational mechanics based Design of Experiments approach...
Mechanical integrity of the dielectric stack is challenged by the trend towards porous, lower dielectric constant interlayer dielectric (ILD) materials. As a result, fracture in the ILD stacks caused either by assembly process or by the dicing process is an important reliability consideration. In general, there is a need to either assess the propensity of the structure to fracture under assembly conditions,...
Insulated gate bipolar transistors are the power semiconductors used for high current applications as a switching device. It is widely used in electrical and hybrid vehicles. It has become increasingly important to understand the reliability of these modules. The lifetime prediction is based on the assumption that the solder interconnections are the weakest part of the module assembly and that the...
Transient liquid phase (TLP) soldering is one option for high temperature interconnects with the advantage of processing conditions being close to those for conventional soldering. In the Cu-Sn system addressed in the paper, a high post-processed melting point of the solder interconnects is achieved due to the formation of Cu6Sn5 and Cu3Sn intermetallic compounds (IMC). A specific low melting solder...
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