The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
A brief presentation of the NOI — Nothing On Insulator — nanotransistor, followed by two theoretical points of view concerning the NOI-FET non-linearity are presented in this paper. The main target is to prove the NOI nanotransistor affiliation to the FETs family, monitoring the gate-control on the drain current. The drain current is activated by the VDS voltage under tunneling conditions. The gate...
Single-Event-Burnout (SEB) is a catastrophic failure mode in power semiconductor devices triggered by cosmic ray heavy ions. Thus, it is essential to improve the robustness of these devices under this environment. In this paper a new design of planar insulated gate bipolar transistor (IGBT) aimed at improving the immunity to SEB is proposed and validated by employing 3D Sentaurus — simulation. We...
The emerging smart power BCD technologies allow smaller device sizes hence, under the same operating conditions, the device must dissipate the same amount of power on a much smaller area, which leads to a more pronounced self — heating effect. Therefore, accurate prediction of heat dissipation in the DMOS structure, up to thermal runaway, is necessary. We have designed a test structure capable of...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.