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This work proposes a new fault-tolerant method able to deal with open and shortcut circuit faults in SRAM-based FPGA routing connections. The bitflips provoked by upsets in the routing control memory cells are the major concern in SRAM-based FPGAs, since these memory cells represent the majority of the bits in the configuration bitstream. Even in an application hardened by triple modular redundancy...
Space systems require high reliability nonvolatile memory. This paper analyzes the reliability of an EEPROM for data retention, endurance and radiation performance across multiple die lots.
A series of total ionizing dose (TID) measurements were performed on commercial hard drives to explore the possible uses of the devices for the high radiation mission, and to help the understanding of the reliability of current hard drive technology. Three different models from three major manufacturers were tested with the aid of a commercial hard drive test system.
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