The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
With complexities of Systems-on-Chip (SOCs) rising almost daily, the design community has been searching for a new methodology that can handle given complexities with increased productivity and decreased time-to-market. The obvious solution that comes to mind is increasing levels of abstraction, or in other words, increasing the size of the basic building blocks. However, it is not clear what these...
This paper tries to find out whether commonly used spot defect fault model is still viable for deep sub-micron (DSM) integrated circuits' test and yield model. It is believed that for DSM products spot defects may be no longer major source of yield loss. Results from number of computer experiments are presented and discussed.
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.