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Delivering mismatch data that reflect design reality is a real challenge. Indeed, from test structures to final data utilization, many steps can be the source of distortion. The first possible source of distortion is linked to the differences in terms of environment and spacing that might exist between test structure transistors and circuit transistors. The second potential source of distortion is...
In medical and automotive applications, device reliability needs to be assessed with great precision. It is therefore mandatory to investigate deeply the extrinsic behavior of memory devices to optimize their operating specifications in order to obtain the best endurance and retention characteristics. In this paper, we describe a new methodology to characterize the extrinsic behaviors of EEPROM devices...
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