In this paper, the switching performances of two state-of-the-art half-bridge SiC MOSFET modules are evaluated using a standard double pulse test methodology. The selected modules are commercially available, and have the same voltage and current ratings. A comparative study is carried out under various conditions such as similar dv/dt, di/dt, and current and voltage overshoots. Additionally, the lab setup is simulated in LTspice in order to investigate the impact of stray inductances in the switching performances. Both the simulations and the experimental measurements give insight in the significance of low inductive layouts to utilize the fast switching feature of SiC.