This paper addresses the statistical modeling and simulation of high-speed interconnects with uncertain physical properties and nonlinear dynamical terminations. The proposed approach is based on the expansion of voltage and current variables in terms of orthogonal polynomials of random variables. It extends the available literature results on the generation of an augmented deterministic SPICE equivalent of the stochastic link to the case in which the terminations are nonlinear and dynamical, like those modeling IC buffers. A single and standard SPICE simulation of the aforementioned equivalent circuit allows to efficiently compute the expansion coefficients that provide statistical information pertinent to the interconnect response. The feasibility and strength of the approach are demonstrated by means of a coupled microstrip interconnect with drivers and receivers.