2012 IEEE International Conference on Microelectronic Test Structures > 61 - 65
Source
Abstract
Identifiers
book ISSN : | 1071-9032 |
book ISBN : | 978-1-4673-1027-7 |
book e-ISBN : | 978-1-4673-1030-7 , 978-1-4673-1029-1 |
DOI | 10.1109/ICMTS.2012.6190614 |