29th VLSI Test Symposium > 146 - 151
Source
Abstract
Identifiers
book ISSN : | 1093-0167 |
book ISBN : | 978-1-61284-657-6 |
book e-ISBN : | 978-1-61284-656-9 , 978-1-61284-655-2 |
DOI | 10.1109/VTS.2011.5783775 |
29th VLSI Test Symposium > 146 - 151
book ISSN : | 1093-0167 |
book ISBN : | 978-1-61284-657-6 |
book e-ISBN : | 978-1-61284-656-9 , 978-1-61284-655-2 |
DOI | 10.1109/VTS.2011.5783775 |