Material transfer in a low-power direct-current switchgear is commonly known to cause contact failures to open due to mechanical interlocking, which is determined by (i) the shape of the material transfer pip-and-crater formation and (ii) the relative movement of the contact pieces during contact separation. The aim of this work is to analyze the influence of multiple arcing parameters on the evolving material transfer shape and the tendency towards possible interlocking of AgNi 0.15 and AgSnO2-88/12 contacts by a combined analysis of the spatial assembly of the transferred material shapes in the contact area and the relative movement of the contact pieces. Based on a 3D precision alignment method presented at the 54th IEEE Holm Conference on Electrical Contacts, the evolving material transfer shape at the cathode and the anode, respectively, as well as the gap between the corresponding shapes were analyzed for AgNi 0.15 and AgSnO2-88/12 contacts. Additionally, the gap in the closed position between the corresponding material transfer shapes is gauged (closest distance vector of each surface point between the two opposing surfaces) and therefore predictions of the influence of the contact material and varied opening directions on the tendency towards interlocking can be made. Finally we conclude that the AgNi 0.15 experiments were less vulnerable with regard to interlocking than Ag/SnO2-88/12 because material transfer in Ag/SnO2 has a higher pip height to width ratio and local gap contractions between the material transfer pip and the crater in the closed position.