2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) > 255 - 258
Source
Abstract
Identifiers
book ISBN : | 978-1-4244-1616-5 |
book e-ISBN : | 978-1-4244-1617-2 |
DOI | 10.1109/VDAT.2008.4542461 |
book ISBN : | 978-1-4244-1616-5 |
book e-ISBN : | 978-1-4244-1617-2 |
DOI | 10.1109/VDAT.2008.4542461 |