Metrology and Measurement Systems
Metrology and Measurement Systems > 2011 > Vol. 18, nr 4 > 691-699
Metrology and Measurement Systems > 2011 > Vol. 18, nr 4 > 583-596
Metrology and Measurement Systems > 2011 > Vol. 18, nr 4 > 659-666
Metrology and Measurement Systems > 2011 > Vol. 18, nr 4 > 645-658
Metrology and Measurement Systems > 2011 > Vol. 18, nr 4 > 631-643
Metrology and Measurement Systems > 2011 > Vol. 18, nr 4 > 621-630
Metrology and Measurement Systems > 2011 > Vol. 18, nr 4 > 667-678
Metrology and Measurement Systems > 2011 > Vol. 18, nr 4 > 679-690
Metrology and Measurement Systems > 2011 > Vol. 18, nr 4 > 713-721
Metrology and Measurement Systems > 2011 > Vol. 18, nr 4 > 529-542
Metrology and Measurement Systems > 2011 > Vol. 18, nr 4 > 607-620
Metrology and Measurement Systems > 2011 > Vol. 18, nr 4 > 701-711
Metrology and Measurement Systems > 2011 > Vol. 18, nr 4 > 569-582
Metrology and Measurement Systems > 2011 > Vol. 18, nr 4 > 555-568
Metrology and Measurement Systems > 2011 > Vol. 18, nr 4 > 505-528
Metrology and Measurement Systems > 2011 > Vol. 18, nr 4 > 597-605
Metrology and Measurement Systems > 2011 > Vol. 18, nr 4 > 543-554