Metrology and Measurement Systems
Metrology and Measurement Systems > 2002 > Vol. 9, nr 1 > 55-65
Metrology and Measurement Systems > 2002 > Vol. 9, nr 2 > 89-99
Metrology and Measurement Systems > 2002 > Vol. 9, nr 4 > 401-412
Metrology and Measurement Systems > 2004 > Vol. 11, nr 1 > 3-19
Metrology and Measurement Systems > 2004 > Vol. 11, nr 1 > 61-101
Metrology and Measurement Systems > 2004 > Vol. 11, nr 3 > 209-220
Metrology and Measurement Systems > 2004 > Vol. 11, nr 3 > 221-234
Metrology and Measurement Systems > 2005 > Vol. 12, nr 1 > 27-45
Metrology and Measurement Systems > 2009 > Vol. 16, nr 2 > 233-248
Metrology and Measurement Systems > 2010 > Vol. 17, nr 3 > 397-403
Metrology and Measurement Systems > 2013 > Vol. 20, nr 4 > 623--634
Metrology and Measurement Systems > 2015 > Vol. 22, nr 1 > 13--24
Metrology and Measurement Systems > 2016 > Vol. 23, nr 1 > 143--154
Metrology and Measurement Systems > 2018 > Vol. 25, nr 1 > 103--114
Metrology and Measurement Systems > 2018 > Vol. 25, nr 2 > 253--267
Metrology and Measurement Systems > 2018 > Vol. 25, nr 3 > 561--575
Metrology and Measurement Systems > 2019 > Vol. 26, nr 1 > 153--169
Metrology and Measurement Systems > 2019 > Vol. 26, nr 4 > 687--696
Metrology and Measurement Systems > 2022 > Vol. 29, nr 1 > 93--108