Metrology and Measurement Systems
Metrology and Measurement Systems > 2012 > Vol. 19, nr 1 > 85-94
Metrology and Measurement Systems > 2012 > Vol. 19, nr 1 > 73-84
Metrology and Measurement Systems > 2012 > Vol. 19, nr 1 > 39-48
Metrology and Measurement Systems > 2012 > Vol. 19, nr 1 > 115-122
Metrology and Measurement Systems > 2012 > Vol. 19, nr 1 > 105-114
Metrology and Measurement Systems > 2012 > Vol. 19, nr 1 > 49-62
Metrology and Measurement Systems > 2012 > Vol. 19, nr 1 > 141-150
Metrology and Measurement Systems > 2012 > Vol. 19, nr 1 > 123-132
Metrology and Measurement Systems > 2012 > Vol. 19, nr 1 > 3-28
Metrology and Measurement Systems > 2012 > Vol. 19, nr 1 > 29-38
Metrology and Measurement Systems > 2012 > Vol. 19, nr 1 > 95-104
Metrology and Measurement Systems > 2012 > Vol. 19, nr 1 > 151-158
Metrology and Measurement Systems > 2012 > Vol. 19, nr 1 > 63-71
Metrology and Measurement Systems > 2012 > Vol. 19, nr 1 > 133-140
Metrology and Measurement Systems > 2012 > Vol. 19, nr 1 > 159-168
Metrology and Measurement Systems > 2012 > Vol. 19, nr 2 > 321-332
Metrology and Measurement Systems > 2012 > Vol. 19, nr 2 > 355-364
Metrology and Measurement Systems > 2012 > Vol. 19, nr 2 > 343-354
Metrology and Measurement Systems > 2012 > Vol. 19, nr 2 > 307-320
Metrology and Measurement Systems > 2012 > Vol. 19, nr 2 > 203-218