Metrology and Measurement Systems
Metrology and Measurement Systems > 2005 > Vol. 12, nr 3 > 263-274
Metrology and Measurement Systems > 2005 > Vol. 12, nr 4 > 355-370
Metrology and Measurement Systems > 2006 > Vol. 13, nr 3 > 325-251
Metrology and Measurement Systems > 2007 > Vol. 14, nr 3 > 361-374
Metrology and Measurement Systems > 2007 > Vol. 14, nr 4 > 577-593
Metrology and Measurement Systems > 2007 > Vol. 14, nr 4 > 483-494
Metrology and Measurement Systems > 2007 > Vol. 14, nr 4 > 495-506
Metrology and Measurement Systems > 2008 > Vol. 15, nr 4 > 441-456
Metrology and Measurement Systems > 2009 > Vol. 16, nr 2 > 299-311
Metrology and Measurement Systems > 2009 > Vol. 16, nr 2 > 279-288
Metrology and Measurement Systems > 2009 > Vol. 16, nr 2 > 209-218
Metrology and Measurement Systems > 2011 > Vol. 18, nr 3 > 371-378
Metrology and Measurement Systems > 2011 > Vol. 18, nr 4 > 543-554
Metrology and Measurement Systems > 2012 > Vol. 19, nr 1 > 39-48
Metrology and Measurement Systems > 2012 > Vol. 19, nr 2 > 295-306
Metrology and Measurement Systems > 2013 > Vol. 20, nr 3 > 359--370
Metrology and Measurement Systems > 2014 > Vol. 21, nr 3 > 521--534
Metrology and Measurement Systems > 2020 > Vol. 27, nr 4 > 641--657
Metrology and Measurement Systems > 2022 > Vol. 29, nr 3 > 455--468