Bulletin of the Polish Academy of Sciences. Technical Sciences > 2006 > Vol. 54, nr 1 > 19-23
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journal ISSN : | 0239-7528 |
journal e-ISSN : | 2300-1917 |
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Bibliography
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[1] G. Binnig, H. Rohrer, and E. Weibel, “Surface studies by scanning tunneling microscopy”, Phys. Rev. Lett. 49, (1982).
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[2] T. Gotszalk, F. Shi, P. Grabiec, P. Dumania, P. Hudek, and I.W. Rangelow, “Fabrication of the multipurpose piezoresistive wheatstone bridge cantilever with conductive microtip for electrostatic force microscopy and scaning capacitance microscopy”, J. Vac. Sci. Techn. B16 (6), 3948 (1998).
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[3] T. Gotszalk, P. Czarnecki, P. Grabiec, K. Domanski, M. Zaborowski, I.W. Rangelow, “Microfabricated cantilever with metallic tip for electrostatic and capacitance microscopy and its application to investigation of semiconductor devices”, J. Vac. Sci. Technol. B 22, 506 (2004).