Search results for: Thomas Mikolajick
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 324 - 330
2016 IEEE International Electron Devices Meeting (IEDM) > 11.6.1 - 11.6.4
IEEE Electron Device Letters > 2012 > 33 > 9 > 1300 - 1302