Search results for: H. Lee
2016 IEEE International Electron Devices Meeting (IEDM) > 31.7.1 - 31.7.4
2015 IEEE International Reliability Physics Symposium > 5A.6.1 - 5A.6.5
2015 IEEE International Reliability Physics Symposium > 4A.2.1 - 4A.2.5
2015 IEEE International Reliability Physics Symposium > 3A.4.1 - 3A.4.6
2013 IEEE International Electron Devices Meeting > 2.5.1 - 2.5.4
2012 IEEE International Reliability Physics Symposium (IRPS) > 3B.4.1 - 3B.4.6
IEEE Electron Device Letters > 2011 > 32 > 3 > 381 - 383
2010 International Electron Devices Meeting > 5.4.1 - 5.4.4