Search results for: H. Kim
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 7 > 1360 - 1364
2015 IEEE International Reliability Physics Symposium > 6A.3.1 - 6A.3.5
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 2 > 280 - 291
2013 IEEE International Electron Devices Meeting > 29.2.1 - 29.2.4
2013 IEEE International Reliability Physics Symposium (IRPS) > 4A.3.1 - 4A.3.4
2013 IEEE International Reliability Physics Symposium (IRPS) > 4A.5.1 - 4A.5.5
2012 IEEE International Reliability Physics Symposium (IRPS) > 2F.5.1 - 2F.5.6
2012 IEEE International Reliability Physics Symposium (IRPS) > 4C.1.1 - 4C.1.8
IEEE Transactions on Circuits and Systems I: Regular Papers > 2012 > 59 > 3 > 584 - 593
2011 International Reliability Physics Symposium > 2B.4.1 - 2B.4.4
IEEE Journal of Solid-State Circuits > 2011 > 46 > 10 > 2374 - 2385
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 4 > 603 - 614
2010 International Electron Devices Meeting > 4.2.1 - 4.2.4
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 6 > 947 - 956