Search results for: Y. Gao
2016 IEEE International Conference on Dielectrics (ICD) > 2 > 1069 - 1072
IEEE Electron Device Letters > 2013 > 34 > 3 > 351 - 353
2011 International Reliability Physics Symposium > XT.8.1 - XT.8.6
2016 IEEE International Conference on Dielectrics (ICD) > 2 > 1069 - 1072
IEEE Electron Device Letters > 2013 > 34 > 3 > 351 - 353
2011 International Reliability Physics Symposium > XT.8.1 - XT.8.6