Wyniki wyszukiwania dla: V. Huard
Microelectronics Reliability > 2017 > 76-77 > C > 92-96
Microelectronics Reliability > 2017 > 76-77 > C > 13-24
2017 IEEE International Reliability Physics Symposium (IRPS) > 3A-4.1 - 3A-4.7
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-7.1 - XT-7.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 3A-2.1 - 3A-2.7
2017 IEEE International Reliability Physics Symposium (IRPS) > CR-8.1 - CR-8.4
2017 IEEE International Reliability Physics Symposium (IRPS) > 4C-4.1 - 4C-4.7
Microelectronics Reliability > 2016 > 64 > C > 158-162
Microelectronics Reliability > 2016 > 64 > C > 163-167
Lecture Notes in Computer Science > Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation > Session 5 - Power Modeling and Optimization > 191-200
2016 IEEE International Reliability Physics Symposium (IRPS) > XT-9-1 - XT-9-4
2016 IEEE International Reliability Physics Symposium (IRPS) > 4C-3-1 - 4C-3-5
2016 IEEE International Reliability Physics Symposium (IRPS) > 7C-2-1 - 7C-2-7