Search results for: James C. Sturm
IEEE Journal of Solid-State Circuits > 2017 > 52 > 1 > 309 - 321
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 255 - 262
2012 International Electron Devices Meeting > 12.3.1 - 12.3.4
IEEE Electron Device Letters > 2011 > 32 > 1 > 36 - 38
IEEE Transactions on Electron Devices > 2011 > 58 > 9 > 2924 - 2927
IEEE Transactions on Electron Devices > 2010 > 57 > 10 > 2381 - 2389