Search results for: R.D. Schrimpf
Microelectronics Reliability > 2014 > 54 > 3 > 570-574
Solid State Electronics > 2012 > 78 > Complete > 75-79
Microelectronics Reliability > 2011 > 51 > 12 > 2093-2096
Microelectronic Engineering > 2011 > 88 > 7 > 1259-1264
Solid State Electronics > 2010 > 54 > 10 > 1155-1159
Solid State Electronics > 2010 > 54 > 9 > 841-848
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 157 - 163
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3361 - 3366
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3244 - 3249
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3115 - 3121
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3210 - 3217
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3250 - 3255
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3158 - 3164
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3085 - 3092