Search results for: V. Ancarani
2007 IEEE International Electron Devices Meeting > 921 - 924
Microelectronics Reliability > 2007 > 47 > 4-5 > 602-605
IEEE Transactions on Electron Devices > 2007 > 54 > 6 > 1376 - 1383
The European Physical Journal B > 2000 > 18 > 3 > 405-411
Nuclear Inst. and Methods in Physics Research, B > 1996 > 116 > 1-4 > 342-346