The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
In today's technology, reliability is one of the major challenges. Process variations and increasing power density in advanced technology nodes make the condition even worse. Process variations during manufacturing induce delay variations and such variations may manifest into faults at the higher temperature during operation. Delay faults at higher functional temperature is a critical factor for the...
As technology scales, small and dense geometries, and process variations introduce defects that are often not detected by single stuck-at tests. To improve defect coverage, we expand the single stuck-at tests to cover multiple stuck-at faults. This paper investigates multiple stuck-at fault (MSAF) testability of ROBDD (Reduced Ordered Binary Decision Diagram) based fully delay testable combinational...
In-field test is becoming important due to reliability concerns arising from aggressive technology scaling coupled with variation in manufacturing process. In advanced technology nodes, increasing delay variation and decreasing delay tolerance makes the condition worse. Conventional scan based delay test environment can be different from the normal operation of a circuit and has drawbacks like area...
Network delay may occur on the LTE (Long Term Evolution) network due to signaling spikes. This decreases quality of experience (QoE). In this paper, we propose a method for mitigating the effect of such a delay. Our method acts as “a concierge” to divert the attention of users away from delay. The biggest advantage of our method is that it can be implemented at lower cost (e.g. capital investment)...
Due to the continuous shrinking of semiconductor technology, there are more and more variations in the process of manufacturing chips. From the viewpoint of analyzing the functionality of a chip, variation may change the overall "observed" behavior of the chip. In this paper, we discuss additional delays caused by variation that may generate changes of observed behaviors. In the first part...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.