Search results for: Peng Cheng
Annals of Nuclear Energy > 2017 > 109 > C > 82-91
IEEE Transactions on Electron Devices > 2011 > 58 > 8 > 2573 - 2581
CICED 2010 Proceedings > 1 - 7
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 431 - 439
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 440 - 448
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 479 - 487