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Today's mainstream electronic systems typically assume that transistors and interconnects operate correctly over their useful lifetime. With enormous complexity and significantly increased vulnerability to failures compared to the past, future system designs cannot rely on such assumptions. For coming generations of silicon technologies, several causes of hardware reliability failures, largely benign...
A large class of robust electronic systems of the future must be designed to perform correctly despite hardware failures. In contrast, today's mainstream systems typically assume error-free hardware. Classical fault-tolerant computing techniques are too expensive for this purpose. This paper presents an overview of new techniques that can enable a sea change in the design of cost-effective robust...
Robust system design ensures that future systems continue to meet user expectations despite rising levels of underlying disturbances. This paper discusses two essential aspects of robust system design: 1. Effective post-silicon validation, despite staggering complexity of future systems, using a new technique called Instruction Footprint Recording and Analysis (IFRA). 2. Cost-effective design of systems...
Circuit failure prediction predicts the occurrence of a circuit failure "before" errors actually appear in system data and states. This is in contrast to classical error detection where a failure is detected after errors appear in system data and states. Circuit failure prediction is performed concurrently during system operation or during periodic on-line self-test by analyzing the data...
The idea behind circuit failure prediction is to predict the occurrence of a circuit failure before errors actually appear in system data and states. This concept enables a sea change in robust system design by overcoming major reliability challenges such as circuit aging and early-life failures (infant mortality).
Summary form only given. Circuit failure prediction predicts the occurrence of a circuit failure before errors actually appear in system data and states. This is in contrast to classical error detection where a failure is detected after errors appear in system data and states. Circuit failure prediction is performed during system operation by analyzing the data collected by sensors inserted at various...
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