Search results for: Xiang Gao
IEEE Electron Device Letters > 2017 > 38 > 4 > 509 - 512
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 474 - 477
IEEE Electron Device Letters > 2014 > 35 > 5 > 527 - 529
IEEE Transactions on Electron Devices > 2014 > 61 > 3 > 747 - 754
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3099 - 3104
IEEE Electron Device Letters > 2012 > 33 > 7 > 982 - 984
IEEE Electron Device Letters > 2012 > 33 > 7 > 988 - 990
IEEE Electron Device Letters > 2011 > 32 > 6 > 755 - 757
IEEE Electron Device Letters > 2011 > 32 > 3 > 309 - 311
IEEE Electron Device Letters > 2011 > 32 > 5 > 617 - 619
IEEE Electron Device Letters > 2011 > 32 > 7 > 889 - 891
IEEE Electron Device Letters > 2011 > 32 > 11 > 1525 - 1527
IEEE Electron Device Letters > 2011 > 32 > 12 > 1680 - 1682
2010 International Electron Devices Meeting > 30.4.1 - 30.4.4