Search results for: Yi Chu
Proceedings of the IEEE > 2010 > 98 > 7 > 1197 - 1207
IEEE Electron Device Letters > 2008 > 29 > 1 > 11 - 14
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 4 > 500 - 508
IEEE Transactions on Electron Devices > 2006 > 53 > 12 > 2901 - 2907
Optics Communications > 2004 > 237 > 4-6 > 363-369